Anno 1995

[62]      P.Daponte, L.Nigro, F.Tisato: "Integrating the user interface in an object-oriented measurement system". Measurement, vol.15, No.2, April 1995, pp.91-101.

[63]      P.Daponte, D.Grimaldi, L.Michaeli: "Gray code ADC based on an analog neural circuit". Radioengineering, vol.4, No.1, April 1995, pp.7-12.

[64]      P.Arpaia, F.Cennamo, P.Daponte, M.D'Apuzzo: "Dynamic characterization of scan conversion-based transient digitizers". IEEE Trans. on Instrum. and Meas., vol.44, No.3, June 1995, pp.643-646.

[65]      P.Daponte: "Electronically compensated current transformer modelling". Measurement, vol.15, No.4, July 1995, pp.213-222.

[66]      P.Daponte, C.Liguori, A.Pietrosanto: "Real time harmonic analysis by multiple deep dip windows". Proc. of Int. IMEKO Symp. on Modern Electrical and Magnetic Measurements, Prague, 13-14/Sept./1995, vol.3, pp.609-613.

[67]      P.Daponte, C.De Capua, A.Molinaro: "A non iterative fast frequency and phase estimator for sinewaves". Proc. of Int. IMEKO Symp. on Modern Electrical and Magnetic Measurements, Prague, 13-14/Sept./1995, vol.3, pp.645-649.

[68]      A.Baccigalupi, P.Daponte, D.Grimaldi: "An N-winding transformer model including stray capacitances". Proc. of Int. IMEKO Symp. on Modern Electrical and Magnetic Measurements, Prague, 13-14/Sept./1995, vol.3, pp.650-654.

[69]      P.Daponte, L.Angrisani: "Tecniche digitali e strumenti per la misura di spessori sottili". Atti del Congresso Annuale del Gruppo Misure Elettriche ed Elettroniche, Bologna, 21-23/Sett./1995, pp.206-212.

[70]      P.Daponte, D.Grimaldi, A.Molinaro, Ya.D.Sergeyev: "An algorithm for finding zero crossing of time signals with Lipschitzean derivatives". Measurement, vol.16, No.1, Sept. 1995, pp.37-49.

[71]      F.Cennamo, P.Daponte, D.Grimaldi, E.Loizzo: "A new neural A/D converter architecture". Measurement, vol.16, No.3, November 1995, pp.177-186.

[72]      P.Daponte, F.Maceri, R.S.Olivito: "Ultrasonic signal-processing techniques for the measurement of damage growth in structural materials". IEEE Trans. on Instrum. and Meas., vol.44, No.6, Dec. 1995, pp.1003-1008.